Distributed I/O Tier Reliability/Dependability

Main project: DI/OT

Project description

The Distributed I/O Tier (DI/OT) hardware kit is currently being developed to serve within a variety of accelerator control systems including critical applications. To ensure a high level of dependability in these applications a methodological approach is pursued defining a variety of activities during several life cycle phases.

Documents

Main Document - DI/OT Dependability Strategy

DIOT_DependabilityMainDoc_V1.1 (Approved 11/2021)

Analysis Reports

• Top Level Analysis Report
• COTS PSU Selection (restricted access)
• RaToPUS Analysis Report
• Radtol System Board Analysis Report
• nanoFIP FMC Analysis Report
• MoniMods Analysis Report
• Nonrad System Board Analysis Report
• DIOT Crate Analysis report

Isograph Model Files

• Isograph repository (various)
• Radtol variant FTA (Status 11/2022, to be updated for future versions)
• Isograph user manual (Status 11/2022)

Testing Reports

• Radtol SB Validation Testing Report (Rev. 0.2)
• Nonrad SB Validation Testing Report (Rev. 0.1)

Presentations

Reliability Engineering and its Adoption for the DI/OT, BE-CO Technical Meeting, 08.10.2020 (CERN access only)
R2E: Strategy for DI/OT Dependability Studies, R2E BE/CO status and plans, 25.06.2020; Ensuring high-reliability for the DI/OT hardware kit, R2E Annual Meeting - 2021, 03.02.2021
Designing, Validating and Demonstrating High Reliability for the DI/OT Hardware Kit RAS WG meeting, 25.03.2021
DI/OT Design and Qualification for High Reliability, DI/OT Technical Review, 16.03.2022 (CERN access only)

Contacts

• Volker Schramm - (not at CERN anymore)
• Rudy Ferraro - CERN

Status