... | @@ -21,6 +21,7 @@ To ensure a high level of dependability in these applications a methodological a |
... | @@ -21,6 +21,7 @@ To ensure a high level of dependability in these applications a methodological a |
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- [COTS PSU Selection](https://edms.cern.ch/document/2610175/1) (restricted access)
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- [COTS PSU Selection](https://edms.cern.ch/document/2610175/1) (restricted access)
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- [RaToPUS Analysis Report](https://edms.cern.ch/document/2646619/1)
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- [RaToPUS Analysis Report](https://edms.cern.ch/document/2646619/1)
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- [Radtol System Board Analysis Report](https://edms.cern.ch/document/2683622/1)
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- [Radtol System Board Analysis Report](https://edms.cern.ch/document/2683622/1)
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- [nanoFIP FMC Analysis Report](https://edms.cern.ch/document/2694084/1)
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**Isograph Model Files**
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**Isograph Model Files**
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... | @@ -34,7 +35,8 @@ To ensure a high level of dependability in these applications a methodological a |
... | @@ -34,7 +35,8 @@ To ensure a high level of dependability in these applications a methodological a |
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[Reliability Engineering and its Adoption for the DI/OT](https://indico.cern.ch/event/955668/), *BE-CO Technical Meeting, 08.10.2020* (CERN access only)
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[Reliability Engineering and its Adoption for the DI/OT](https://indico.cern.ch/event/955668/), *BE-CO Technical Meeting, 08.10.2020* (CERN access only)
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R2E: [Strategy for DI/OT Dependability Studies](https://indico.cern.ch/event/930394/), *R2E BE/CO status and plans, 25.06.2020*; [Ensuring high-reliability for DI/OT hardware kit](https://indico.cern.ch/event/971222/contributions/4159955/attachments/2183129/3688243/DIOT_Reliability_R2E_AnnualMeeting_VS_20210203.pdf), *R2E Annual Meeting - 2021, 03.02.2021*
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R2E: [Strategy for DI/OT Dependability Studies](https://indico.cern.ch/event/930394/), *R2E BE/CO status and plans, 25.06.2020*; [Ensuring high-reliability for DI/OT hardware kit](https://indico.cern.ch/event/971222/contributions/4159955/attachments/2183129/3688243/DIOT_Reliability_R2E_AnnualMeeting_VS_20210203.pdf), *R2E Annual Meeting - 2021, 03.02.2021*
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[Designing, Validating and Demonstrating High Reliability for the DI/OT Hardware Kit](https://indico.cern.ch/event/997719/) *RAS WG meeting, 25.03.2021*
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[Designing, Validating and Demonstrating High Reliability for the DI/OT Hardware Kit](https://indico.cern.ch/event/997719/) *RAS WG meeting, 25.03.2021*
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[DI/OT Design and Qualification for High Reliability](https://indico.cern.ch/event/1135029/), *DI/OT Technical Review, 16.03.2022* (CERN access only)
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## Contacts
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## Contacts
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... | | ... | |