Commit 2f026700 authored by Federico Vaga's avatar Federico Vaga

kernel: remove internal trigger test

Never used and in v5 it will disappear from the gateware as well
Signed-off-by: Federico Vaga's avatarFederico Vaga <federico.vaga@cern.ch>
parent ac1e8ddc
......@@ -22,9 +22,6 @@ FMC_PARAM_GATEWARE(fa_dev_drv);
static int fa_enable_test_data;
module_param_named(enable_test_data, fa_enable_test_data, int, 0444);
static int fa_internal_trig_test = 0;
module_param_named(internal_trig_test, fa_internal_trig_test, int, 0444);
static const int zfad_hw_range[] = {
[FA100M14B4C_RANGE_10V] = 0x45,
[FA100M14B4C_RANGE_1V] = 0x11,
......@@ -351,9 +348,6 @@ static int __fa_init(struct fa_dev *fa)
/* Set test data register */
fa_writel(fa, fa->fa_adc_csr_base, &zfad_regs[ZFA_CTL_TEST_DATA_EN],
fa_enable_test_data);
/* Set internal trigger test mode */
fa_writel(fa, fa->fa_adc_csr_base, &zfad_regs[ZFAT_CFG_TEST_EN],
fa_internal_trig_test);
/* Set to single shot mode by default */
fa_writel(fa, fa->fa_adc_csr_base, &zfad_regs[ZFAT_SHOTS_NB], 1);
......
......@@ -27,7 +27,6 @@ const struct zfa_field_desc zfad_regs[] = {
[ZFAT_CFG_HW_EN] = {0x08, 0x00000004, 1},
[ZFAT_CFG_SW_EN] = {0x08, 0x00000008, 1},
[ZFAT_CFG_INT_SEL] = {0x08, 0x00000030, 1},
[ZFAT_CFG_TEST_EN] = {0x08, 0x00000040, 1},
[ZFAT_CFG_THRES_FILT] = {0x08, 0x0000FF00, 1},
[ZFAT_CFG_THRES] = {0x08, 0xFFFF0000, 1},
/* Delay */
......
......@@ -133,7 +133,6 @@ enum zfadc_dregs_enum {
ZFAT_CFG_SW_EN,
ZFAT_CFG_INT_SEL,
ZFAT_CFG_THRES,
ZFAT_CFG_TEST_EN,
ZFAT_CFG_THRES_FILT,
/* Delay*/
ZFAT_DLY,
......
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