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DIOT reliability studies project
DIOT reliability studies project

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Last edited by Volker Schramm
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Distributed I/O Tier Reliability/Dependability

Main project: DI/OT

Project description

The Distributed I/O Tier (DI/OT) hardware kit is currently being developed to serve within a variety of accelerator control systems including critical applications. To ensure a high level of dependability in these applications a methodological approach is pursued defining a variety of activities during several life cycle phases.

Methodology

Documents

Main Document - DI/OT Dependability Strategy

DIOT_DependabilityMainDoc_V1.1 (Approved 11/2021)

Analysis Reports

Isograph Model Files

Isograph repository (various)

Testing Reports

Presentations

Reliability Engineering and its Adoption for the DI/OT, BE-CO Technical Meeting, 08.10.2020 (CERN access only)
R2E: Strategy for DI/OT Dependability Studies, R2E BE/CO status and plans, 25.06.2020; Ensuring high-reliability for DI/OT hardware kit, R2E Annual Meeting - 2021, 03.02.2021
Designing, Validating and Demonstrating High Reliability for the DI/OT Hardware Kit RAS WG meeting, 25.03.2021

Contacts

Status

Date Event
06/2020 Start of the project
06/2021 Main dependability strategy doc V1 sent for review
11/2021 Main dependability strategy doc approved; First analysis report uploaded (RaToPUS)