Distributed IO Tier Reliability/Dependability

Main project: DI/OT

Project description

The Distributed I/O Tier (DI/OT) hardware kit is currently being developed to serve within a variety of accelerator control systems including critical applications. To ensure a high level of dependability in these applications a methodological approach is pursued defining a variety of activities during several life cycle phases.

Documents

Presentations

Reliability Engineering and its Adoption for the DI/OT (CERN access only)
BE-CO Technical Meeting, 08.10.2020

Contacts

• Volker Schramm - CERN

Status