Distributed IO Tier Reliability/Dependability
Main project: DI/OT
The Distributed I/O Tier (DI/OT) hardware kit is currently being developed to serve within a variety of accelerator control systems including critical applications. To ensure a high level of dependability in these applications a methodological approach is pursued defining a variety of activities during several life cycle phases.
Reliability Engineering and its Adoption for the DI/OT (CERN access only)
BE-CO Technical Meeting, 08.10.2020
- Volker Schramm - CERN
|06/2020||Start of the project|